The spectrometer irSys® E is based on the well known principle of scanning grating spectrometers with electrostatic driven micromechanical scanning mirror.
irSys® E Spektrometer The spectrometer with the ability to be integrated into processes.
The spectrometer irSys® E is based on the well known principle of scanning grating spectrometers with electrostatic driven micromechanical scanning mirror.
- Compact dimensions
- Low weight
- Short data aquisition time
- High durability (no wear on mirror)
- Flexible configuration for different applications
Radiation to be analyzed passes an entry slit, strikes a diffraction grating and is decomposed into its spectral components. Having passed exit slits, those spectral components reach two different detectors to be captured successively. The selection of the relevant wavelengths is done by a micro-mechanical mirror (MEMS) which leads the radiation entered to the grating while varying its angle of incidence. Using the provided software, the individual spectra of the two sensors are combined into an overall spectrum. Due to the scanning method with its approximately 250 double passes per second, the spectrometer is especially suited for analysis of temporally time-constant spectra.
General data/basic data
Stray light:
- -30 dB
Slit width (alternatives):
- 300 µm (350 µm, 250 µm, 200 µm, 150 µm)
Wavelength accuracy (after automatic calibration):
- < 1 nm; ± 0,1 nm short time jitter
Scan time:
- 4 ms
Measurement throughput:
- 80 spectra / minute
Recommended fiber:
- 400 µm; 0,22 NA
Fiber port:
- SMA 905
Temperature range:
- 5...45 °C
Dimensions:
- 138 mm x 89 mm x 66 mm
Weight:
- 840g
Interfaces to host:
- USB / RS-485
Software:
- Win XP / Win 7