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Glossary

all items 0-9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
AOI
Automatic optical inspection
ARM Cortex™-A9
Microcontroller based on ARM Architecture
BGA
Ball Grid Array
BST
Boundary-Scan-Test
CEM
Contract Electronic Manufacturing
COM
Computer-on-module
DFL
Design for Longevity, Longevity optimized design
DfM
Design for manufacturing
DFR
Design for Reliability
DFS
Design for Service
DfT
Design for Testability
DTC/DFC
Design to Cost / Design for Cost effectivity
EBB
Embedded Building Blocks
Embedded System
Embedded System
EMC
Electromagnetic Compatibility
EOL
End of life
FCT
Function test
FPT
Flying Probe Test
HMI
Human Machine Interface
ICT
In-Circuit-Test
IPC
Industrial PC
Layout
Layout
NRND
Not Recommended for New Designs
ODM
Original Design Manufacturer
OEM
Original Equipment Manufacturer
OM
Obsolescence Management
Outsourcing
Outsourcing
P2020
QorIQ processor
PCN
Product Change Notification
PLM
Product Lifecycle Management
QorIQ™
Microcontroller based on Power Architecture
Rapid Prototyping
Rapid Prototyping
RoHS
Restriction of hazardous substances
Smart Metering
Smart Metering
SMD
Surface Mounted Device
SMT
Surface Mount Technology
Target Costing
Target Costing
THT
Through Hole Technology
Traceability
Traceability

Company News

7.03.2018

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